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Ruoff, Rodney S.
Center for Multidimensional Carbon Materials (CMCM)
Research Interests
  • Next generation carbons, ultrathin sp3-bonded carbon sheets, negative curvature (‘Schwartzites’) carbons, sp3/sp2 hybrid carbon materials, model compounds for novel carbon materials, reaction mechanisms

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Mesoscale imperfections in MoS2 atomic layers grown by a vapor transport technique

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Title
Mesoscale imperfections in MoS2 atomic layers grown by a vapor transport technique
Author
Liu, YingnanGhosh, RudreshWu, DiIsmach, ArielRuoff, Rodney S.Lai, Keji
Keywords
Molybdenum disulfide; 2D materials; atomic layers; mesoscopic defects; microwave impedance microscopy; grain boundary
Issue Date
201408
Publisher
AMER CHEMICAL SOC
Citation
NANO LETTERS, v.14, no.8, pp.4682 - 4686
Abstract
The success of isolating small flakes of atomically thin layers through mechanical exfoliation has triggered enormous research interest in graphene and other two-dimensional materials. For device applications, however, controlled large-area synthesis of highly crystalline monolayers with a low density of electronically active defects is imperative. Here, we demonstrate the electrical imaging of dendritic ad-layers and grain boundaries in monolayer molybdenum disulfide (MoS2) grown by a vapor transport technique using microwave impedance microscopy. The micrometer-sized precipitates in our films, which appear as a second layer of MoS2 in conventional height and optical measurements, show ∼2 orders of magnitude higher conductivity than that of the single layer. The zigzag grain boundaries, on the other hand, are shown to be more resistive than the crystalline grains, consistent with previous studies. Our ability to map the local electrical properties in a rapid and nondestructive manner is highly desirable for optimizing the growth process of large-scale MoS2 atomic layers.
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DOI
http://dx.doi.org/10.1021/nl501782e
ISSN
1530-6984
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