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THE GROWTH OF CRYSTALLINE VAPOR-DEPOSITED CARBON-60 THIN-FILMS

Author(s)
KRAKOW, WRIVERA, NMROY, RARUOFF, RSCUOMO, JJ
Issued Date
1993-03
DOI
10.1007/BF00539472
URI
https://scholarworks.unist.ac.kr/handle/201301/54562
Fulltext
https://link.springer.com/article/10.1007%2FBF00539472
Citation
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, v.56, no.3, pp.185 - 192
Abstract
Thin films (25-2500 angstrom) of C60 molecules have been deposited on both (001) NaCl and mica substrates at varying temperatures by resistive evaporation. Both electron diffraction and high resolution microscopy have been used to assess the degree of crystallinity, the orientational ordering and the nature of the defects present in these face-centered-cubic films. For NaCl, optimum conditions yielded polycrystalline films with a tendency towards a [110] orientation, while for mica, extended single crystal films have been fabricated which exhibit a [111] direction normal to the film surface.
Publisher
SPRINGER VERLAG
ISSN
0947-8396
Keyword
SCANNING TUNNELING MICROSCOPYELECTRON-MICROSCOPYC60C-60

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