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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 152 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 145 | - |
dc.citation.title | CARBON | - |
dc.citation.volume | 47 | - |
dc.contributor.author | Yang, Dongxing | - |
dc.contributor.author | Velamakanni, Aruna | - |
dc.contributor.author | Bozoklu, Guelay | - |
dc.contributor.author | Park, Sungjin | - |
dc.contributor.author | Stoller, Meryl | - |
dc.contributor.author | Piner, Richard D. | - |
dc.contributor.author | Stankovich, Sasha | - |
dc.contributor.author | Jung, Inhwa | - |
dc.contributor.author | Field, Daniel A. | - |
dc.contributor.author | Ventrice, Carl A., Jr. | - |
dc.contributor.author | Ruoff, Rodney S. | - |
dc.date.accessioned | 2023-12-22T08:10:23Z | - |
dc.date.available | 2023-12-22T08:10:23Z | - |
dc.date.created | 2021-10-19 | - |
dc.date.issued | 2009-01 | - |
dc.description.abstract | Several nanometer-thick graphene oxide films deposited on silicon nitride-on silicon substrates were exposed to nine different heat treatments (three in Argon, three in Argon and Hydrogen, and three in ultra-high vacuum), and also a film was held at 70 degrees C while being exposed to a vapor from hydrazine monohydrate. The films were characterized with atomic force microscopy to obtain local thickness and variation in thickness over extended regions. X-ray photoelectron spectroscopy was used to measure significant reduction of the oxygen content of the films; heating in ultra-high vacuum was particularly effective. The overtone region of the Raman spectrum was used, for the first time, to provide a "fingerprint" of changing oxygen content. | - |
dc.identifier.bibliographicCitation | CARBON, v.47, no.1, pp.145 - 152 | - |
dc.identifier.doi | 10.1016/j.carbon.2008.09.045 | - |
dc.identifier.issn | 0008-6223 | - |
dc.identifier.scopusid | 2-s2.0-56949104599 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/54376 | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0008622308005022?via%3Dihub | - |
dc.identifier.wosid | 000262143500018 | - |
dc.language | 영어 | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | Chemical analysis of graphene oxide films after heat and chemical treatments by X-ray photoelectron and Micro-Raman spectroscopy | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical; Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Chemistry; Materials Science | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | GRAPHITE | - |
dc.subject.keywordPlus | XPS | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.subject.keywordPlus | REDUCTION | - |
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