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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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Numerical Simulation of Field-Induced Inter-Band Tunneling Effect Transistor Using TCAD-Based Device Simulator

Author(s)
Kim, Kyung RokNone
Issued Date
2006-06-26
URI
https://scholarworks.unist.ac.kr/handle/201301/51945
Citation
IEEE 64th Annual Device Research Conference, pp.119 - 120
Publisher
IEEE Electron Device Society

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