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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 125 | - |
| dc.citation.startPage | 124 | - |
| dc.citation.title | Microscopy & Microanalysis 2009 | - |
| dc.citation.volume | 15 | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Dato, Albert | - |
| dc.contributor.author | Jeon, Ki-Joon | - |
| dc.contributor.author | Erni, Rolf | - |
| dc.contributor.author | Richardson, Thomas J. | - |
| dc.contributor.author | Frenklach, Michael | - |
| dc.contributor.author | Radmilovic, Velimir | - |
| dc.date.accessioned | 2023-12-20T04:07:25Z | - |
| dc.date.available | 2023-12-20T04:07:25Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2009-07-27 | - |
| dc.identifier.bibliographicCitation | Microscopy & Microanalysis 2009, v.15, pp.124 - 125 | - |
| dc.identifier.doi | 10.1017/S143192760998985 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/51679 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | Atomic resolution imaging and spectroscopy of graphene using the TEAM 0.5 | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2009-07-27 | - |
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