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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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dc.citation.conferencePlace US -
dc.citation.endPage 699 -
dc.citation.startPage 698 -
dc.citation.title Microscopy & Microanalysis 2009 -
dc.citation.volume 12 -
dc.contributor.author Yuk, Jong Min -
dc.contributor.author Kim, Kwanpyo -
dc.contributor.author Lee, Zonghoon -
dc.contributor.author Watanabe, Masashi -
dc.contributor.author Zettl, Alex -
dc.contributor.author Lee, Jeong Yong -
dc.contributor.author No, Young Soo -
dc.contributor.author Kim, Tae Whan -
dc.contributor.author Choi, Won Kook -
dc.date.accessioned 2023-12-20T04:07:25Z -
dc.date.available 2023-12-20T04:07:25Z -
dc.date.created 2014-12-23 -
dc.date.issued 2009-07-27 -
dc.identifier.bibliographicCitation Microscopy & Microanalysis 2009, v.12, pp.698 - 699 -
dc.identifier.issn 1431-9276 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/51678 -
dc.publisher Microscopy Society of America -
dc.title In-situ TEM observation of metal Zn nanocrystal growth on ZnO films -
dc.type Conference Paper -
dc.date.conferenceDate 2009-07-27 -

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