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Chung, Moses
Intense Beam and Accelerator Lab.
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dc.citation.number 1 -
dc.citation.startPage R01001 -
dc.citation.title JOURNAL OF INSTRUMENTATION -
dc.citation.volume 16 -
dc.contributor.author Arutunian, S. G. -
dc.contributor.author Margaryan, A., V -
dc.contributor.author Harutyunyan, G. S. -
dc.contributor.author Lazareva, E. G. -
dc.contributor.author Chung, Moses -
dc.contributor.author Kwak, D. -
dc.contributor.author Gyulamiryan, D. S. -
dc.date.accessioned 2023-12-21T16:22:04Z -
dc.date.available 2023-12-21T16:22:04Z -
dc.date.created 2021-03-24 -
dc.date.issued 2021-01 -
dc.description.abstract The vibrating wire monitor proposed herein is based on the strong dependence of the frequency of the pinched wire on its temperature. This dependence allows the measurement of a particle/X-ray/gamma-ray beam that deposits part of its energy on the wire. A wide measured temperature range from fractions of mK to hundreds of degrees allows the detection of beam properties at a given position of the wire in space. It also enables preparing profiling of a beam in a large dynamic range by scanning the wire through the beam. This review paper presents information on various applications of a vibrating wire, including the method of resonance target and the use of wire oscillations as a scanner for the profiling of thin beams. -
dc.identifier.bibliographicCitation JOURNAL OF INSTRUMENTATION, v.16, no.1, pp.R01001 -
dc.identifier.doi 10.1088/1748-0221/16/01/R01001 -
dc.identifier.issn 1748-0221 -
dc.identifier.scopusid 2-s2.0-85099778551 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/50584 -
dc.identifier.url https://iopscience.iop.org/article/10.1088/1748-0221/16/01/R01001 -
dc.identifier.wosid 000608276000001 -
dc.language 영어 -
dc.publisher Institute of Physics -
dc.title Vibrating wire monitor: Versatile instrumentation for particle and photon beam measurements with wide dynamic range -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation -
dc.relation.journalResearchArea Instruments & Instrumentation -
dc.type.docType Review -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Beam-line instrumentation (beam position and profile monitors -
dc.subject.keywordAuthor beam-intensity monitors bunch length monitors) -
dc.subject.keywordAuthor Instrumentation for particle accelerators and storage rings - high energy (linear accelerators, synchrotrons) -
dc.subject.keywordAuthor Instrumentation for particle accelerators and storage rings - low energy (linear accelerators, cyclotrons, electrostatic accelerators) -
dc.subject.keywordAuthor Instrumentation for synchrotron radiation accelerators -
dc.subject.keywordPlus PROFILE MEASUREMENTS -

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