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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system

Author(s)
Park, JunsikLee, WooryongKim, NamsuKang, BonggyuRyu, ChunghyunLee, JongsungJo, CheolguKim, Jingook
Issued Date
2021-06
DOI
10.1080/09205071.2021.1884135
URI
https://scholarworks.unist.ac.kr/handle/201301/50582
Fulltext
https://www.tandfonline.com/doi/full/10.1080/09205071.2021.1884135
Citation
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, v.35, no.9, pp.1247 - 1260
Abstract
System-level electrostatic discharge (ESD) noise due to electromagnetic fields radiating from an ESD generator were measured and analyzed in a solid-state drive (SSD) storage system. The field sources of an ESD generator were efficiently modeled from the measured tangential magnetic fields in front of a ESD generator. The extracted field sources were incorporated into a full-wave solver, and the fields inside the disk-array enclosure (DAE) were simulated and validated by comparing to measured fields. The field source models of the ESD generator were then also utilized to predict transient ESD-induced noise voltages in a simplified SSD. Finally, the coupling mechanism and the effects of the DAE geometry were investigated.
Publisher
TAYLOR & FRANCIS LTD
ISSN
0920-5071
Keyword (Author)
Electrostatic discharge (ESD)electromagnetic immunitynoise couplingnear-field scanningHuygens’s principleESD generator

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