There are no files associated with this item.
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.citation.number | 4 | - |
dc.citation.startPage | 043119 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 103 | - |
dc.contributor.author | Kong, X. H. | - |
dc.contributor.author | Ji, H. X. | - |
dc.contributor.author | Piner, R. D. | - |
dc.contributor.author | Li, H. F. | - |
dc.contributor.author | Magnuson, C. W. | - |
dc.contributor.author | Tan, C. | - |
dc.contributor.author | Ismach, A. | - |
dc.contributor.author | Chou, H. | - |
dc.contributor.author | Ruoff, R. S. | - |
dc.date.accessioned | 2023-12-22T03:40:57Z | - |
dc.date.available | 2023-12-22T03:40:57Z | - |
dc.date.created | 2020-08-18 | - |
dc.date.issued | 2013-07 | - |
dc.description.abstract | Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness. | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.103, no.4, pp.043119 | - |
dc.identifier.doi | 10.1063/1.4816752 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.scopusid | 2-s2.0-84885014385 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/47592 | - |
dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.4816752 | - |
dc.identifier.wosid | 000322406600097 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | DOMAINS | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Tel : 052-217-1404 / Email : scholarworks@unist.ac.kr
Copyright (c) 2023 by UNIST LIBRARY. All rights reserved.
ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.