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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Santa Clara, CA | - |
| dc.citation.endPage | 1071 | - |
| dc.citation.startPage | 1052 | - |
| dc.citation.title | DesignCon 2013: Where Chipheads Connect | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.contributor.author | Shin, D | - |
| dc.contributor.author | Lee, J | - |
| dc.contributor.author | Cho, S | - |
| dc.contributor.author | Hwang, C | - |
| dc.contributor.author | Fan, J | - |
| dc.date.accessioned | 2023-12-20T01:09:27Z | - |
| dc.date.available | 2023-12-20T01:09:27Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2013-01-28 | - |
| dc.description.abstract | A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer. | - |
| dc.identifier.bibliographicCitation | DesignCon 2013: Where Chipheads Connect, pp.1052 - 1071 | - |
| dc.identifier.scopusid | 2-s2.0-84883717231 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46776 | - |
| dc.language | 영어 | - |
| dc.publisher | DesignCon 2013 | - |
| dc.title | Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2013-01-28 | - |
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