File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Choi, EunMi
- THz Vacuum Electronics and Applied Electromagnetics Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Monterey, CA | - |
| dc.citation.endPage | 470 | - |
| dc.citation.startPage | 469 | - |
| dc.citation.title | 15th IEEE International Vacuum Electronics Conference, IVEC 2014 | - |
| dc.contributor.author | Choi, Eun Mi | - |
| dc.contributor.author | Lee, Ingeun | - |
| dc.contributor.author | Kim, Kwanghoon | - |
| dc.contributor.author | Choe, Munseok | - |
| dc.contributor.author | Lee, Dongjoon | - |
| dc.date.accessioned | 2023-12-20T00:07:48Z | - |
| dc.date.available | 2023-12-20T00:07:48Z | - |
| dc.date.created | 2014-09-16 | - |
| dc.date.issued | 2014-04-23 | - |
| dc.description.abstract | This paper presents electric field pattern measurements by an excellent field scanning system using a stable electro-optic (EO) field probe. It provides higher resolution and less field distortions than a metal based probe. We simulated a TE02 gyrotron mode converter by CST Microwave Studio and estimated the mode converter field pattern at 28 GHz. The field-calibrated EO sensor demonstrated up to 60 dB of Signal to Noise Ratio (SNR). Finally, we compared both results using the Cross Correlation Function (CCF). The schematic of the EO probe scanning system and estimation results are provided. | - |
| dc.identifier.bibliographicCitation | 15th IEEE International Vacuum Electronics Conference, IVEC 2014, pp.469 - 470 | - |
| dc.identifier.doi | 10.1109/IVEC.2014.6857693 | - |
| dc.identifier.scopusid | 2-s2.0-84905380968 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46744 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/6857693 | - |
| dc.language | 영어 | - |
| dc.publisher | 15th IEEE International Vacuum Electronics Conference, IVEC 2014 | - |
| dc.title | Precise measurement of field patterns from a TE02 mode converter using the electro-optic probe scanning system | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2014-04-22 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.