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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 서울대학교 글로벌공학교육센터 | - |
| dc.citation.title | 46차 한국현미경학회 춘계학술대회 | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Kim, Kwanpyo | - |
| dc.contributor.author | Kim, Jung Hwa | - |
| dc.date.accessioned | 2023-12-19T22:36:14Z | - |
| dc.date.available | 2023-12-19T22:36:14Z | - |
| dc.date.created | 2016-01-13 | - |
| dc.date.issued | 2015-05-28 | - |
| dc.identifier.bibliographicCitation | 46차 한국현미경학회 춘계학술대회 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/42073 | - |
| dc.language | 영어 | - |
| dc.publisher | 한국현미경학회 | - |
| dc.title | Observation of Grain Boundaries from Moire Fringe of Two-dimensional Graphene | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2015-05-28 | - |
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