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Park, Noejung
Computational Physics & Electronic Structure Lab.
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Nitrogen-doped graphene nanoplatelets from simple solution edge-functionalization for n-type field-effect transistors

Author(s)
Chang, Dong WookLee, Eun KwangPark, Eun YeobYu, HojeongChoi, Hyun-JungJeon, In-YupSohn, Gyung-JooShin, DongbinPark, NoejungOh, Joon HakDai, LimingBaek, Jong-Beom
Issued Date
2013-06
DOI
10.1021/ja402555n
URI
https://scholarworks.unist.ac.kr/handle/201301/4140
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879403681
Citation
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.135, no.24, pp.8981 - 8988
Abstract
The development of a versatile method for nitrogen-doping of graphitic structure is an important challenge for many applications, such as energy conversions and storages and electronic devices. Here, we report a simple but efficient method for preparing nitrogen-doped graphene nanoplatelets via wet-chemical reactions. The reaction between monoketone (C=O) in graphene oxide (GO) and monoamine-containing compound produces imine (Shiff base) functionalized GO (iGO). The reaction between α-diketone in GO and 1,2-diamine (ortho-diamine)-containing compound gives stable pyrazine ring functionalized GO (pGO). Subsequent heat-treatments of iGO and pGO result in high-quality, nitrogen-doped graphene nanoplatelets to be designated as hiGO and hpGO, respectively. Of particular interest, hpGO was found to display the n-type field-effect transistor behavior with a charge neutral point (Dirac point) located at around -16 V. Furthermore, hpGO showed hole and electron mobilities as high as 11.5 and 12.4 cm2V-1s-1, respectively.
Publisher
AMER CHEMICAL SOC
ISSN
0002-7863

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