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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Jeju | - |
| dc.citation.title | Dasan Conference 2015 (invited talk) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Ryu, Gyeong Hee | - |
| dc.contributor.author | Park, Hyo ju | - |
| dc.contributor.author | Kim, Jung Hwa | - |
| dc.contributor.author | Kim, Na Yeon | - |
| dc.date.accessioned | 2023-12-19T21:37:39Z | - |
| dc.date.available | 2023-12-19T21:37:39Z | - |
| dc.date.created | 2016-01-13 | - |
| dc.date.issued | 2015-11-02 | - |
| dc.identifier.bibliographicCitation | Dasan Conference 2015 (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39193 | - |
| dc.language | 영어 | - |
| dc.publisher | The Korean Federation of Science and Technology Socity (KOFST) | - |
| dc.title | Characterization of Defects in 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy (invited talk) | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2015-11-02 | - |
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