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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 제24회 한국반도체학술대회 | - |
| dc.contributor.author | Jo, Yongsu | - |
| dc.contributor.author | Kwak, Jinsung | - |
| dc.contributor.author | Park, Soon-Dong | - |
| dc.contributor.author | Kim, Na Yeon | - |
| dc.contributor.author | Kim, Se-Yang | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Kim, Sung Youb | - |
| dc.contributor.author | Kwon, Soon-Yong | - |
| dc.date.accessioned | 2023-12-19T19:36:32Z | - |
| dc.date.available | 2023-12-19T19:36:32Z | - |
| dc.date.created | 2018-01-12 | - |
| dc.date.issued | 2017-02-14 | - |
| dc.identifier.bibliographicCitation | 제24회 한국반도체학술대회 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/38717 | - |
| dc.language | 영어 | - |
| dc.publisher | 한국반도체산업협회 외 | - |
| dc.title | Facile Observation of Intrinsic Graphene Defects of Different Origins through Selective Oxygen Transport | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2017-02-13 | - |
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