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DC Field | Value | Language |
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dc.citation.endPage | 1443 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 1432 | - |
dc.citation.title | ACTA MATERIALIA | - |
dc.citation.volume | 61 | - |
dc.contributor.author | Gianola, D. S. | - |
dc.contributor.author | Lee, Zonghoon | - |
dc.contributor.author | Ophus, C. | - |
dc.contributor.author | Luber, E. J. | - |
dc.contributor.author | Mitlin, D. | - |
dc.contributor.author | Dahmen, U. | - |
dc.contributor.author | Hemker, K. J. | - |
dc.contributor.author | Radmilovic, V. R. | - |
dc.date.accessioned | 2023-12-22T04:10:24Z | - |
dc.date.available | 2023-12-22T04:10:24Z | - |
dc.date.created | 2013-07-04 | - |
dc.date.issued | 2013-03 | - |
dc.description.abstract | The exceptional strength and distinct deformation physics exhibited by pure ultrafine-grained and nanocrystalline metals in comparison to their microcrystalline counterparts have been ascribed to the dominant influence of grain boundaries in accommodating plastic flow. Such grain-boundary-mediated mechanisms can be augmented by additional strengthening in nanocrystalline alloys via solute and precipitate interactions with dislocations, although its potency is a function of the changes in the elastic properties of the alloyed material. In this study, we investigate the elastic and plastic properties of Al1-xMox alloys (0 <= x <= 0.32) by tensile testing of sputter-deposited freestanding thin films. Isotropic elastic constants and strength are measured over the composition range for which three microstructural regimes are identified, including solid solutions, face-centered cubic and amorphous phase mixtures and body-centered cubic (bcc)/amorphous mixtures. Whereas the bulk modulus is measured to follow the rule of mixtures over the Mo composition range, the Young's and shear moduli do not. Poisson's ratio is non-monotonic with increasing Mo content, showing a discontinuous change at the onset of the bcc/amorphous two-phase region. The strengthening measured in alloyed thin films can be adequately predicted in the solid solution regime only by combining solute strengthening with a grain boundary pinning model. The single-step co-sputtering procedure presented here results in diversity of alloy compositions and microstructures, offering a promising avenue for tailoring the mechanical behavior of thin films. | - |
dc.identifier.bibliographicCitation | ACTA MATERIALIA, v.61, no.5, pp.1432 - 1443 | - |
dc.identifier.doi | 10.1016/j.actamat.2012.11.020 | - |
dc.identifier.issn | 1359-6454 | - |
dc.identifier.scopusid | 2-s2.0-84873701792 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/3782 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84873701792 | - |
dc.identifier.wosid | 000316036800002 | - |
dc.language | 영어 | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | Tensile behavior of Al1-xMox crystalline and amorphous thin films | - |
dc.type | Article | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary; Metallurgy & Metallurgical Engineering | - |
dc.relation.journalResearchArea | Materials Science; Metallurgy & Metallurgical Engineering | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Thin films | - |
dc.subject.keywordAuthor | MEMS/NEMS | - |
dc.subject.keywordAuthor | Amorphous metals | - |
dc.subject.keywordAuthor | Nanocrystalline metals | - |
dc.subject.keywordAuthor | Elastic properties | - |
dc.subject.keywordPlus | MOLECULAR-DYNAMICS SIMULATION | - |
dc.subject.keywordPlus | GRAIN-BOUNDARY MOTION | - |
dc.subject.keywordPlus | ELECTRODEPOSITED NANOCRYSTALLINE NICKEL | - |
dc.subject.keywordPlus | STRAIN-RATE SENSITIVITY | - |
dc.subject.keywordPlus | METALLIC-GLASS PLATES | - |
dc.subject.keywordPlus | MECHANICAL-BEHAVIOR | - |
dc.subject.keywordPlus | ROOM-TEMPERATURE | - |
dc.subject.keywordPlus | NANOSTRUCTURED MATERIALS | - |
dc.subject.keywordPlus | PLASTIC-DEFORMATION | - |
dc.subject.keywordPlus | ALUMINUM FILMS | - |
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