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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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Probability density calculation of step pulse responses at a 3-D IC channel with supply voltage fluctuations

Author(s)
Kim, JingookPark, EunkyeongLee, JunhoShon, Kwansu
Issued Date
2013-12-12
DOI
10.1109/EDAPS.2013.6724449
URI
https://scholarworks.unist.ac.kr/handle/201301/37387
Fulltext
https://ieeexplore.ieee.org/document/6724449
Citation
2013 6th IEEE Electrical Design of Advanced Packaging Systems Symposium, EDAPS 2013, pp.28 - 31
Abstract
Causal transient step responses at a silicon interposer channel and at a wire-bond channel are calculated from the channel transfer functions obtained in frequency domain. Also, the probability densities of the step response with supply voltage fluctuations are analytically calculated.
Publisher
IEEE
ISBN
978-147992311-3

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