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DC Field | Value | Language |
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dc.citation.endPage | 7 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 1 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 51 | - |
dc.contributor.author | Shin, Sunhae | - |
dc.contributor.author | Kang, In Man | - |
dc.contributor.author | Kim, Kyung Rok | - |
dc.date.accessioned | 2023-12-22T05:08:43Z | - |
dc.date.available | 2023-12-22T05:08:43Z | - |
dc.date.created | 2013-06-18 | - |
dc.date.issued | 2012-06 | - |
dc.description.abstract | In this paper, we propose a radio-frequency (RF) model and parameter extraction method for vertical junctionless silicon nanowire (VJL SNW) field-effect transistors (FETs) using three-dimensional (3D) device simulation. We introduce the substrate-related components such as the substrate resistance (R-sub) and drain-to-substrate capacitance (C-sub), and evaluate the RF performance such as f(t), f(max), gate input capacitance, and transport time delay. A quasi-static (QS) RF model has been used in simulation program with integrated circuit emphasis (SPICE) circuit simulator to simulate VJL SNW FETs with RF parameters extracted from 3D device simulated Y-parameters. We confirmed the validity of our RF model by the well-matched results between HSPICE and 3D device simulation in terms of the Y-parameters and the S-22-parameter up to 100 GHz. | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.6, pp.1 - 7 | - |
dc.identifier.doi | 10.1143/JJAP.51.06FE20 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.scopusid | 2-s2.0-84863326479 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/3510 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84863326479 | - |
dc.identifier.wosid | 000306189800067 | - |
dc.language | 영어 | - |
dc.publisher | JAPAN SOC APPLIED PHYSICS | - |
dc.title | Extraction Method for Substrate-Related Components of Vertical Junctionless Silicon Nanowire Field-Effect Transistors and Its Verification on Radio Frequency Characteristics | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.description.journalRegisteredClass | scie | - |
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