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Yoon, Heein
Advanced Circuits and Electronics Lab.
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dc.citation.conferencePlace KO -
dc.citation.conferencePlace Seoul -
dc.citation.endPage 332 -
dc.citation.startPage 329 -
dc.citation.title IEEE Asian Solid-State Circuits Conference -
dc.contributor.author Park, Suneui -
dc.contributor.author Yoon, Heein -
dc.contributor.author Choi, Jaehyouk -
dc.date.accessioned 2023-12-19T18:06:22Z -
dc.date.available 2023-12-19T18:06:22Z -
dc.date.created 2019-03-21 -
dc.date.issued 2017-11-06 -
dc.description.abstract This work presents an ultra-low phase noise and all-digital frequency generator, providing multiple output-frequencies. In a time-interleaved fashion, the proposed calibrator can continue to correct the multiple output-frequencies of injection-locked DCOs, which can change independently between 0.9 and 1.2GHz. Due to the time-interleaved calibrator, operating continuously in the background, each injection-locked DCO can maintain the excellent noise performance; the 1-MHz phase noise and the RMS-jitter at 930MHz were -132.2dBc/Hz and 310fs, and its variation across temperatures and voltages was less than 9%. © 2017 IEEE. -
dc.identifier.bibliographicCitation IEEE Asian Solid-State Circuits Conference, pp.329 - 332 -
dc.identifier.doi 10.1109/ASSCC.2017.8240283 -
dc.identifier.issn 0000-0000 -
dc.identifier.scopusid 2-s2.0-85045722809 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/35086 -
dc.identifier.url https://ieeexplore.ieee.org/document/8240283 -
dc.language 영어 -
dc.publisher Institute of Electrical and Electronics Engineers Inc. -
dc.title An ultra-low phase noise all-digital multi-frequency generator using injection-locked DCOs and time-interleaved calibration -
dc.type Conference Paper -
dc.date.conferenceDate 2017-11-06 -

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