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DC Field | Value | Language |
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dc.citation.endPage | 409 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 406 | - |
dc.citation.title | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | - |
dc.citation.volume | 7 | - |
dc.contributor.author | Lee, Eunjoo | - |
dc.contributor.author | Kim, Minseo | - |
dc.contributor.author | Seong, Jungwoo | - |
dc.contributor.author | Shin, Heungjoo | - |
dc.contributor.author | Lim, Geunbae | - |
dc.date.accessioned | 2023-12-22T03:47:32Z | - |
dc.date.available | 2023-12-22T03:47:32Z | - |
dc.date.created | 2013-07-02 | - |
dc.date.issued | 2013-06 | - |
dc.description.abstract | We present an L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) capable of imaging the surface topography and the electrochemical activity of nanostructures of interest. Owing to the geometry of the protrusive peak in the L-shaped probe, the distance between the probe electrode and the substrate is maintained precisely at ∼100 nm during surface scanning. The reduction in electrode-to-substrate distance significantly improves the positive feedback current on top of the electrochemically active nanomaterials. The L-shaped nanoprobe successfully acquired simultaneous a topographical image and an electrochemical current image of individual carbon nanotubes (CNTs) in a two-dimensional (2D) CNT network. Schematic diagram of an L-shaped nanoprobe for SECM-AFM: the nanoprobe has a triangular frame nanoelectrode and a protrusive insulating peak at the end of the AFM tip. | - |
dc.identifier.bibliographicCitation | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.7, no.6, pp.406 - 409 | - |
dc.identifier.doi | 10.1002/pssr.201307120 | - |
dc.identifier.issn | 1862-6254 | - |
dc.identifier.scopusid | 2-s2.0-84879012908 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/3272 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879012908 | - |
dc.identifier.wosid | 000320174900008 | - |
dc.language | 영어 | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.title | An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy | - |
dc.type | Article | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Materials Science; Physics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | scanning electrochemical microscopy | - |
dc.subject.keywordAuthor | SECM | - |
dc.subject.keywordAuthor | AFM | - |
dc.subject.keywordAuthor | nanoprobes | - |
dc.subject.keywordAuthor | carbon nanotubes | - |
dc.subject.keywordPlus | HETEROGENEOUS ELECTRON-TRANSFER | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordPlus | PROBES | - |
dc.subject.keywordPlus | SECM | - |
dc.subject.keywordPlus | CANTILEVER | - |
dc.subject.keywordPlus | SURFACES | - |
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