An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
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- An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
- Lee, Eunjoo; Kim, Minseo; Seong, Jungwoo; Shin, Heungjoo; Lim, Geunbae
- AFM; Electrochemical activities; Electrochemical currents; Force microscopy; Scanning electrochemical microscopy; SECM; Surface scanning; Topographical images
- Issue Date
- WILEY-V C H VERLAG GMBH
- PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.7, no.6, pp.406 - 409
- We present an L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) capable of imaging the surface topography and the electrochemical activity of nanostructures of interest. Owing to the geometry of the protrusive peak in the L-shaped probe, the distance between the probe electrode and the substrate is maintained precisely at ∼100 nm during surface scanning. The reduction in electrode-to-substrate distance significantly improves the positive feedback current on top of the electrochemically active nanomaterials. The L-shaped nanoprobe successfully acquired simultaneous a topographical image and an electrochemical current image of individual carbon nanotubes (CNTs) in a two-dimensional (2D) CNT network. Schematic diagram of an L-shaped nanoprobe for SECM-AFM: the nanoprobe has a triangular frame nanoelectrode and a protrusive insulating peak at the end of the AFM tip.
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