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김학선

Kim, Hak Sun
Internet of Things System Lab.
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dc.citation.endPage 1228 -
dc.citation.number 7 -
dc.citation.startPage 1244 -
dc.citation.title IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS -
dc.citation.volume 67 -
dc.contributor.author Choi, Eunho -
dc.contributor.author Kim, Seongmun -
dc.contributor.author Park, K -
dc.contributor.author Heo, Sanghyun -
dc.contributor.author Ma, Hyunggun -
dc.contributor.author Namgoong, Gyeongho -
dc.contributor.author Kim, Haksun -
dc.contributor.author Bien, Franklin -
dc.date.accessioned 2023-12-21T17:17:32Z -
dc.date.available 2023-12-21T17:17:32Z -
dc.date.created 2020-01-12 -
dc.date.issued 2020-07 -
dc.description.abstract This brief presents a readout IC with a 20 V high-voltage (HV) transmitter (Tx) and On-Chip Differentially Modulated Time-Interleaved Sensing Method (DM-TISM) in a BCD process for a mutual-capacitive Transparent Fingerprint Sensor (TFPS) in order to achieve high SNR, AC & DC offset reduction, high noise immunity, and compensate for the signal loss under thick cover glass. A proposed readout IC with on-chip DM-TISM is composed of 42 identical HV Tx channels, 32 identical Rx channels, and a diamond-patterned TFPS. The performance results including those for transient noise show that the DM-TISM achieves greater SNR than conventional TISM. The measured raw data show that the proposed readout IC achieves SNR of 32 dB with current consumption of 25 mA for the Tx and 13 mA for the Rx. It can be applied to any type of mobile device that needs fingerprint recognition. The ICs for the Tx and Rx are fabricated using 0.25-mu m BCD process and 0.18-mu m CMOS process with 1.6 mm x 3.5 mm and 2.5 mm x 2.5 mm areas, respectively. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.67, no.7, pp.1244 - 1228 -
dc.identifier.doi 10.1109/TCSII.2019.2937541 -
dc.identifier.issn 1549-7747 -
dc.identifier.scopusid 2-s2.0-85088248219 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/30787 -
dc.identifier.url https://ieeexplore.ieee.org/document/8815871 -
dc.identifier.wosid 000543961700012 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title A 32-dB SNR Readout IC with 20-Vpp Tx Using On-Chip DM-TISM in HV BCD Process for Mutual-Capacitive Fingerprint Sensor -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic -
dc.relation.journalResearchArea Engineering -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor AC & DC offset reduction -
dc.subject.keywordAuthor BCDMOS -
dc.subject.keywordAuthor diamond-patterned TFPS -
dc.subject.keywordAuthor DM-TISM -
dc.subject.keywordAuthor noise immunity -
dc.subject.keywordAuthor readout IC -
dc.subject.keywordAuthor SNR -
dc.subject.keywordAuthor 20 Vpeak-peak Tx with pulse output -

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