BROWSE

Related Researcher

Author

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Research Interests
  • Convergence between circuit and EM domains

ITEM VIEW & DOWNLOAD

Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network

Cited 5 times inthomson ciCited 5 times inthomson ci
Title
Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network
Author
Kim, JingookLi, LiangWu, SongpingWang, HanfengTakita, YuzoTakeuchi, HayatoAraki, KenjiFan, JunDrewniak, James L.
Keywords
Bulk capacitors; Closed-form expression; Consumer devices; Decoupling capacitor; Dynamic noise; Power distribution network; Switching currents; Transient noise; Voltage noise
Issue Date
201210
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.54, no.5, pp.1112 - 1124
Abstract
Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.
URI
Go to Link
DOI
http://dx.doi.org/10.1109/TEMC.2012.2194786
ISSN
0018-9375
Appears in Collections:
ECE_Journal Papers

find_unist can give you direct access to the published full text of this article. (UNISTARs only)

Show full item record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

MENU