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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network
- Author(s)
- Kim, Jingook, Li, Liang, Wu, Songping, Wang, Hanfeng, Takita, Yuzo, Takeuchi, Hayato, Araki, Kenji, Fan, Jun, Drewniak, James L.
- Issued Date
- 2012-10
- Citation
- IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.54, no.5, pp.1112 - 1124
- Abstract
- Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- ISSN
- 0018-9375
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