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Suh, Joonki
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Unusually long free carrier lifetime and metal-insulator band offset in vanadium dioxide

Author(s)
Miller, ChrisTriplett, MarkLammatao, JoelSuh, JoonkiFu, DeyiWu, JunqiaoYu, Dong
Issued Date
2012-02
DOI
10.1103/PhysRevB.85.085111
URI
https://scholarworks.unist.ac.kr/handle/201301/27059
Fulltext
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.85.085111
Citation
PHYSICAL REVIEW B, v.85, no.8, pp.085111
Abstract
Single crystalline vanadium dioxide (VO2) nanobeams offer an ideal material basis for exploring the widely observed insulator-metal transition in strongly correlated materials. Here, we investigate nonequilibrium carrier dynamics and electronic structure in single crystalline VO2 nanobeam devices using scanning photocurrent microscopy in the vicinity of their phase transition. We extracted a Schottky barrier height of similar to 0.3 eV between the metal and the insulator phases of VO2, providing direct evidence of the nearly symmetric band gap opening upon phase transition. We also observed unusually long photocurrent decay lengths in the insulator phase, indicating unexpectedly long minority carrier lifetimes on the order of microseconds, consistent with the nature of carrier recombination between two d-subbands of VO2.
Publisher
AMER PHYSICAL SOC
ISSN
1098-0121
Keyword
FIELD-EFFECT TRANSISTORSSEMICONDUCTOR NANOWIRESTRANSITIONVO2

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