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dc.citation.endPage 4276 -
dc.citation.number 11 -
dc.citation.startPage 4270 -
dc.citation.title ACS PHOTONICS -
dc.citation.volume 5 -
dc.contributor.author Moon, Yoon-Jong -
dc.contributor.author Kim, Sang-Woo -
dc.contributor.author An, Hyeon Seok -
dc.contributor.author Na, Jin-Young -
dc.contributor.author Kim, Young-Bin -
dc.contributor.author Kim, Ji-Hyun -
dc.contributor.author Park, Jang-Ung -
dc.contributor.author Kim, Sun-Kyung -
dc.date.accessioned 2023-12-21T20:06:33Z -
dc.date.available 2023-12-21T20:06:33Z -
dc.date.created 2018-12-13 -
dc.date.issued 2018-11 -
dc.description.abstract Wavelength-scale objects usually diffuse incident light into all directions, thereby resulting in a low transmittance accompanied by a thick haze. The degradation of visibility remains a more challenging problem for metal nanostructures due to the excitation of localized surface plasmon resonances, which impedes their practical use in display applications. Here, we report a broadband, polarization- and angle-independent near-unity transmittance from a network of submicron Ag wires via the suppression of backward scattering. Electromagnetic simulations on a single Ag wire predicted that a conformal, dielectric shell suppresses backward scattering while only boosting the zeroth-order forward scattering. A facile oxidation process on electrospun Ag wires produced Ag/Ag2O core/shell wires randomly dispersed on a glass substrate. Measurements of spatially (1.5 x 1.5 cm(2)) and spectrally (lambda = 480-880 nm) averaged transmittance revealed that Ag/Ag2O wires (with an Ag filling ratio of 3.4%) recorded a transmittance of approximately 99%, relative to a bare glass substrate. A dark-field microscope equipped with a spectrometer quantified the level of the suppressed backward scattering in Ag/Ag2O wires. The scattering engineering technique presented herein will be essential to developing metal particle or wire embedded dielectric films that act as high-transmittance specular surfaces. -
dc.identifier.bibliographicCitation ACS PHOTONICS, v.5, no.11, pp.4270 - 4276 -
dc.identifier.doi 10.1021/acsphotonics.8b01168 -
dc.identifier.issn 2330-4022 -
dc.identifier.scopusid 2-s2.0-85054823426 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/25445 -
dc.identifier.url https://pubs.acs.org/doi/10.1021/acsphotonics.8b01168 -
dc.identifier.wosid 000451496500012 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Engineered Unidirectional Scattering in Metal Wire Networks for Ultrahigh Glass-Like Transparency -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Optics; Physics, Applied; Physics, Condensed Matter -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science; Optics; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor unidirectional scattering -
dc.subject.keywordAuthor metal/oxide core/shell wires -
dc.subject.keywordAuthor optical cloaks -
dc.subject.keywordAuthor electric dipole cancelation -
dc.subject.keywordAuthor transparent electrodes -
dc.subject.keywordPlus LIGHT-SCATTERING -
dc.subject.keywordPlus ELECTRODE -
dc.subject.keywordPlus FILMS -
dc.subject.keywordPlus OXIDE -

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