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Bien, Franklin
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dc.citation.endPage 444 -
dc.citation.number 4 -
dc.citation.startPage 438 -
dc.citation.title JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE -
dc.citation.volume 18 -
dc.contributor.author Ma, Hyunggun -
dc.contributor.author Nam-Goong, Gyeong Ho -
dc.contributor.author Kim, Seulkirom -
dc.contributor.author Lim, Shin-Il -
dc.contributor.author Bien, Franklin -
dc.date.accessioned 2023-12-21T20:18:32Z -
dc.date.available 2023-12-21T20:18:32Z -
dc.date.created 2018-09-19 -
dc.date.issued 2018-08 -
dc.description.abstract The proposed PMU with differential difference amplifier (DDA) promises stable operation, accuracy, and reduced power consumption by reducing the number of operational amplifier from five to one. In addition, digital calibration is applied to improve accuracy of forcing ability. The PMU works under various loads from 12.5 Omega to 50 k Omega In the forcing voltage mode, the PMU forces a voltage of 0 V to 3.5 V. In the forcing current mode, the PMU forces a current of 0.7 mu A to 19 mA. The PMU is fabricated using the Magnachip 0.18-mu m BCD technology. The total area of the PMU including the resistor bank is 2 mu m(2), and the active area is 0.2 mu m(2). -
dc.identifier.bibliographicCitation JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.4, pp.438 - 444 -
dc.identifier.doi 10.5573/JSTS.2018.18.4.438 -
dc.identifier.issn 1598-1657 -
dc.identifier.scopusid 2-s2.0-85052372008 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/25216 -
dc.identifier.url http://www.dbpia.co.kr/Journal/ArticleDetail/NODE07521924 -
dc.identifier.wosid 000442690300004 -
dc.language 영어 -
dc.publisher IEEK PUBLICATION CENTER -
dc.title Differential Difference Amplifier based Parametric Measurement Unit with Digital Calibration -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Physics, Applied -
dc.identifier.kciid ART002375157 -
dc.relation.journalResearchArea Engineering; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Automatic Test Equipment (ATE) -
dc.subject.keywordAuthor Parametric Measurement Unit (PMU) -
dc.subject.keywordAuthor Differential Difference Amplifier (DDA) -
dc.subject.keywordPlus BLOCK -

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