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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 444 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 438 | - |
dc.citation.title | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.volume | 18 | - |
dc.contributor.author | Ma, Hyunggun | - |
dc.contributor.author | Nam-Goong, Gyeong Ho | - |
dc.contributor.author | Kim, Seulkirom | - |
dc.contributor.author | Lim, Shin-Il | - |
dc.contributor.author | Bien, Franklin | - |
dc.date.accessioned | 2023-12-21T20:18:32Z | - |
dc.date.available | 2023-12-21T20:18:32Z | - |
dc.date.created | 2018-09-19 | - |
dc.date.issued | 2018-08 | - |
dc.description.abstract | The proposed PMU with differential difference amplifier (DDA) promises stable operation, accuracy, and reduced power consumption by reducing the number of operational amplifier from five to one. In addition, digital calibration is applied to improve accuracy of forcing ability. The PMU works under various loads from 12.5 Omega to 50 k Omega In the forcing voltage mode, the PMU forces a voltage of 0 V to 3.5 V. In the forcing current mode, the PMU forces a current of 0.7 mu A to 19 mA. The PMU is fabricated using the Magnachip 0.18-mu m BCD technology. The total area of the PMU including the resistor bank is 2 mu m(2), and the active area is 0.2 mu m(2). | - |
dc.identifier.bibliographicCitation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.4, pp.438 - 444 | - |
dc.identifier.doi | 10.5573/JSTS.2018.18.4.438 | - |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.scopusid | 2-s2.0-85052372008 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/25216 | - |
dc.identifier.url | http://www.dbpia.co.kr/Journal/ArticleDetail/NODE07521924 | - |
dc.identifier.wosid | 000442690300004 | - |
dc.language | 영어 | - |
dc.publisher | IEEK PUBLICATION CENTER | - |
dc.title | Differential Difference Amplifier based Parametric Measurement Unit with Digital Calibration | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Physics, Applied | - |
dc.identifier.kciid | ART002375157 | - |
dc.relation.journalResearchArea | Engineering; Physics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Automatic Test Equipment (ATE) | - |
dc.subject.keywordAuthor | Parametric Measurement Unit (PMU) | - |
dc.subject.keywordAuthor | Differential Difference Amplifier (DDA) | - |
dc.subject.keywordPlus | BLOCK | - |
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