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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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Orientation-dependent optical characterization of atomically thin transition metal ditellurides

Author(s)
Hoang, Anh TuanShinde, Sachin M.Katiyar, Ajit K.Dhakal, Krishna P.Chen, XiangKim, HyunminLee, Suk WooLee, ZonghoonAhn, Jong-Hyun
Issued Date
2018-12
DOI
10.1039/C8NR07592A
URI
https://scholarworks.unist.ac.kr/handle/201301/25188
Fulltext
https://pubs.rsc.org/en/Content/ArticleLanding/2018/NR/C8NR07592A#!divAbstract
Citation
NANOSCALE, v.10, no.46, pp.21978 - 21984
Abstract
Molybdenum ditellurides (MoTe2) have recently attracted attention owing to their excellent structurally tunable nature between 1T′(metallic)- and 2H(semiconducting)-phases; thus, the controllable fabrication and critical identification of MoTe2 are highly desired. Here, we semi-controllably synthesized 1T′- and 2H-MoTe2 crystals using the atmospheric pressure chemical vapor deposition (APCVD) technique and studied their grain-orientation dependency using polarization-sensitive optical microscopy, Raman scattering, and second-harmonic generation (SHG) microspectroscopy. The polycrystalline 1T′-MoTe2 phase with quasi-1D “Mo-Mo” zigzag chains showed anisotropic optical absorption, leading to a clear visualization of the lattice domains. On the other hand, 2H-MoTe2 lattice grains did not exhibit any discernible difference under polarized light illumination. The combined aforementioned microscopy techniques could be used as an easy-to-access and non-destructive tool for a quick and solid identification of intended lattice orientation development in industry-scale MoTe2 crystal manufacturing.
Publisher
ROYAL SOC CHEMISTRY
ISSN
2040-3364
Keyword
INVERSION SYMMETRY-BREAKINGFEW-LAYER MOTE2GRAIN-BOUNDARIESMOLYBDENUM-DISULFIDEPHASE-TRANSITION1T&aposSUPERCONDUCTIVITYGROWTHMOS2

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