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Park, Sung Soo
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In Situ Observation of Resistive Switching in an Asymmetric Graphene Oxide Bilayer Structure

Author(s)
Kim, SungkyuJung, Hee JoonKim, Jong ChanLee, Kyung-SunPark, Sung SooDravid, Vinayak P.He, KaiJeong, Hu Young
Issued Date
2018-07
DOI
10.1021/acsnano.8b03806
URI
https://scholarworks.unist.ac.kr/handle/201301/24742
Fulltext
https://pubs.acs.org/doi/10.1021/acsnano.8b03806
Citation
ACS NANO, v.12, no.7, pp.7335 - 7342
Abstract
Graphene oxide decorated with oxygen functional groups is a promising candidate as an active layer in resistive switching devices due to its controllable physical-chemical properties, high flexibility, and transparency. However, the origin of conductive channels and their growth dynamics remain a major challenge. We use in situ transmission electron microscopy techniques to demonstrate that nanoscale graphene oxide sheets bonded with oxygen dynamically change their physical and chemical structures upon an applied electric field. Artificially engineered bilayer reduced graphene oxide films with asymmetric oxygen content exhibit nonvolatile write-once-read-many memory behaviors without experiencing the bubble destruction due to the efficient migration of oxygen ions. We clearly observe that a conductive graphitic channel with a conical shape evolves from the upper oxygen-rich region to the lower oxygen-poor region. These findings provide fundamental guidance for understanding the oxygen motions of oxygen-containing carbon materials for future carbon-based nanoelectronics.
Publisher
AMER CHEMICAL SOC
ISSN
1936-0851
Keyword (Author)
graphene oxideresistive switchingin situ TEMbilayer structureconductive filament
Keyword
NONVOLATILE RERAM DEVICESRANDOM-ACCESS MEMORYCONDUCTING NANOFILAMENTSELECTRICAL-CONDUCTIVITYMEMRISTIVE DEVICESTHIN-FILMSULTRAFASTTEMTRANSPARENTELECTRONICS

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