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Chung, Il-Sug
Nano-Optoelectronics Lab.
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dc.citation.endPage 4251 -
dc.citation.number 18 -
dc.citation.startPage 4240 -
dc.citation.title JOURNAL OF LIGHTWAVE TECHNOLOGY -
dc.citation.volume 34 -
dc.contributor.author Taghizadeh, Alireza -
dc.contributor.author Mork, Jesper -
dc.contributor.author Chung, Il-Sug -
dc.date.accessioned 2023-12-21T23:12:18Z -
dc.date.available 2023-12-21T23:12:18Z -
dc.date.created 2018-02-23 -
dc.date.issued 2016-09 -
dc.description.abstract We explore the use of a modal expansion technique, Fourier modal method (FMM), for investigating the optical properties of vertical cavities employing high-contrast gratings (HCGs). Three techniques for determining the resonance frequency and quality factor (Q-factor) of a cavity mode are compared, and the computational uncertainties in the resonance frequency and Q-factor calculations are analyzed. Moreover, a method for reducing a three-dimensional (3D) simulation to lower-dimensional simulations is suggested, which allows for very fast and approximate analysis of a 3D structure. By using the implemented FMM, the scattering losses of several HCG-based vertical cavities with inplane heterostructures which have promising prospects for fundamental physics studies and on-chip laser applications, are investigated. This type of parametric study of 3D structures would be numerically very demanding using spatial discretization techniques. -
dc.identifier.bibliographicCitation JOURNAL OF LIGHTWAVE TECHNOLOGY, v.34, no.18, pp.4240 - 4251 -
dc.identifier.doi 10.1109/JLT.2016.2594214 -
dc.identifier.issn 0733-8724 -
dc.identifier.scopusid 2-s2.0-84990842299 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/23709 -
dc.identifier.url http://ieeexplore.ieee.org/document/7523257/ -
dc.identifier.wosid 000384126100007 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Numerical Investigation of Vertical Cavity Lasers With High-Contrast Gratings Using the Fourier Modal Method -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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