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김덕영

Kim, Duck Young
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DC Field Value Language
dc.citation.number 1 -
dc.citation.startPage 154 -
dc.citation.title SENSORS -
dc.citation.volume 18 -
dc.contributor.author Baek, Woosang -
dc.contributor.author Baek, Sujeong -
dc.contributor.author Kim, Duck Young -
dc.date.accessioned 2023-12-21T21:13:43Z -
dc.date.available 2023-12-21T21:13:43Z -
dc.date.created 2018-02-08 -
dc.date.issued 2018-01 -
dc.description.abstract Many fault detection methods have been proposed for monitoring the health of various industrial systems. Characterizing the monitored signals is a prerequisite for selecting an appropriate detection method. However, fault detection methods tend to be decided with user’s subjective knowledge or their familiarity with the method, rather than following a predefined selection rule. This study investigates the performance sensitivity of two detection methods, with respect to status signal characteristics of given systems: abrupt variance, characteristic indicator, discernable frequency, and discernable index. Relation between key characteristics indicators from four different real-world systems and the performance of two fault detection methods using pattern recognition are evaluated. -
dc.identifier.bibliographicCitation SENSORS, v.18, no.1, pp.154 -
dc.identifier.doi 10.3390/s18010154 -
dc.identifier.issn 1424-8220 -
dc.identifier.scopusid 2-s2.0-85040317300 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/23664 -
dc.identifier.url http://www.mdpi.com/1424-8220/18/1/154 -
dc.identifier.wosid 000423286300153 -
dc.language 영어 -
dc.publisher MDPI AG -
dc.title Characterization of system status signals for multivariate time series discretization based on frequency and amplitude variation -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Chemistry, Analytical; Engineering, Electrical & Electronic; Instruments & Instrumentation -
dc.relation.journalResearchArea Chemistry; Engineering; Instruments & Instrumentation -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor fault detection -
dc.subject.keywordAuthor sensor data -
dc.subject.keywordAuthor frequency domain -
dc.subject.keywordPlus FAULT-DETECTION -
dc.subject.keywordPlus TRANSFORM -
dc.subject.keywordPlus KNOWLEDGE -
dc.subject.keywordPlus MODEL -

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