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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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dc.citation.endPage 186 -
dc.citation.number 3 -
dc.citation.startPage 176 -
dc.citation.title APPLIED MICROSCOPY -
dc.citation.volume 47 -
dc.contributor.author Yoon, Jongchan -
dc.contributor.author Lee, Zonghoon -
dc.date.accessioned 2023-12-21T21:45:06Z -
dc.date.available 2023-12-21T21:45:06Z -
dc.date.created 2017-10-10 -
dc.date.issued 2017-09 -
dc.description.abstract Two-dimensional (2D) materials have been studied widely owing to their outstanding properties since monolayer graphene was isolated in 2004. Especially, among 2D materials, phosphorene, a single atomic layer of black phosphorus (BP), has been highlighted for its electrical properties. This material can serve as a substitute for graphene, which has been revealed as a “semi-metal”, in next-generation semiconductors. However, few-layer BP is prone to degradation under ambient conditions owing to its reactivity with oxygen and water, which results in the condensation of water droplets on the surface of the BP flakes. This causes charge transfer from the phosphorus atom to oxygen, resulting in the formation of phosphoric acid (oxide) and degrades the various properties of BP. Therefore, it is necessary to find passivation methods to prevent BP flakes from being degraded under ambient conditions. This review article deals with recent studies on passivation methods for BP and their performance against oxygen and water, effects on the electrical properties of BP, and the extent to how they protect BP. -
dc.identifier.bibliographicCitation APPLIED MICROSCOPY, v.47, no.3, pp.176 - 186 -
dc.identifier.doi 10.9729/AM.2017.47.3.176 -
dc.identifier.issn 2287-5123 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/22781 -
dc.identifier.url http://www.appmicro.org/journal/view.html?doi=10.9729/AM.2017.47.3.176 -
dc.language 영어 -
dc.publisher 한국현미경학회 -
dc.title Effective Passivation of Black Phosphorus under Ambient Conditions -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.identifier.kciid ART002267129 -
dc.description.journalRegisteredClass kci -

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