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A New Analytical Method for Extracting Precise Structural Parameters of Epitaxial Graphene from Moire Patterns

Author(s)
Lim, HyunseobYang, Hyun JinKim, Yousoo
Issued Date
2016-12
DOI
10.1002/admi.201600826
URI
https://scholarworks.unist.ac.kr/handle/201301/21948
Fulltext
http://onlinelibrary.wiley.com/doi/10.1002/admi.201600826/abstract
Citation
ADVANCED MATERIALS INTERFACES, v.3, no.24, pp.1600826
Abstract
The authors present a new analytical method to determine the most important two parameters, rotational angle (Rθ) and strain (Δa Gr/a Gr) of graphene on metal substrate, from scanning tunneling microscope images. Epitaxial graphene on Ir(111) and Pt(111) was investigated by this method, which demonstrates that rotational angle and strain are not independent factors. Rather, these components influence each other to stabilize the graphene-metal interaction thermodynamically.
Publisher
WILEY-BLACKWELL
ISSN
2196-7350
Keyword
SURFACECOPPERSTRAINSCIENCEGROWTHFOILS

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