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Ferrimagnetism in strained Fe2As thin films on Si(001)

Author(s)
Hwang, YounghunChoi, JeongyongCho, SunglaeKetterson, John B.Tsai, C-C
Issued Date
2009-04
DOI
10.1063/1.3068626
URI
https://scholarworks.unist.ac.kr/handle/201301/21582
Fulltext
http://aip.scitation.org/doi/10.1063/1.3068626
Citation
JOURNAL OF APPLIED PHYSICS, v.105, no.7, pp.07A946
Abstract
We present the structural and magnetic properties of Fe2As thin films grown on Si(100) by molecular beam epitaxy. From the reflection high-energy electron diffraction and x- ray diffraction patterns, the orientation of Fe2As film on Si(100) was found to be a c-axis in the tetragonal crystal structure. The tetragonal Fe2As thin film exhibited ferrimagnetic (FIM) ordering at room temperature. The magnetic moment of Fe2As was 0.1 mu(B)/unit cell determined from the saturated magnetic moment. The observed FIM in Fe2As films was attributed to the strain in the film. (c) 2009 American Institute of Physics.
Publisher
AMER INST PHYSICS
ISSN
0021-8979

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