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김남훈

Kim, Namhun
UNIST Computer-Integrated Manufacturing Lab.
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dc.citation.endPage 376 -
dc.citation.number 6 -
dc.citation.startPage 370 -
dc.citation.title 대한산업공학회지 -
dc.citation.volume 42 -
dc.contributor.author Song, Donghwan -
dc.contributor.author Oh, Yeong Gwang -
dc.contributor.author Kim, Namhun -
dc.date.accessioned 2023-12-21T23:06:28Z -
dc.date.available 2023-12-21T23:06:28Z -
dc.date.created 2016-12-13 -
dc.date.issued 2016-12 -
dc.description.abstract Manufacturing data analysis and its applications are getting a huge popularity in various industries. In spite of the fast advancement in the big data analysis technology, however, the manufacturing quality data monitored from the automated inspection system sometimes is not reliable enough due to the complex patterns of product quality. In this study, thus, we aim to define the level of trusty of an automated quality inspection system and improve the reliability of the quality inspection data. By correlation analysis and feature selection, this paper presents a method of improving the inspection accuracy and efficiency in an SVM-based automatic product quality inspection system using thermal image data in an auto part manufacturing case. The proposed method is implemented in the sealer dispensing process of the automobile manufacturing and verified by the analysis of the optimal feature selection from the quality analysis results. -
dc.identifier.bibliographicCitation 대한산업공학회지, v.42, no.6, pp.370 - 376 -
dc.identifier.doi 10.7232/JKIIE.2016.42.6.370 -
dc.identifier.issn 1225-0988 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/21065 -
dc.identifier.url http://www.dbpia.co.kr/Journal/ArticleDetail/NODE07068985 -
dc.language 한국어 -
dc.publisher 대한산업공학회 -
dc.title.alternative Study on Correlation-based Feature Selection in an Automatic Quality Inspection System using Support Vector Machine (SVM) -
dc.title SVM 기반 자동 품질검사 시스템에서 상관분석 기반 데이터 선정 연구 -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.identifier.kciid ART002172888 -
dc.description.journalRegisteredClass kci -

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