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Jeong, Hu Young
UCRF Electron Microscopy group
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Chemical Vapor Deposition of High-Quality Large-Sized MoS2 Crystals on Silicon Dioxide Substrates

Author(s)
Chen, JianyiTang, WeiTian, BingbingLiu, BoZhao, XiaoxuLiu, YanpengRen, TianhuaLiu, WeiGeng, DechaoJeong, Hu YoungShin, Hyeon SukZhau, WuLoh, Kian Ping
Issued Date
2016-08
DOI
10.1002/advs.201600033
URI
https://scholarworks.unist.ac.kr/handle/201301/20735
Fulltext
http://onlinelibrary.wiley.com/doi/10.1002/advs.201600033/abstract
Citation
ADVANCED SCIENCE, v.3, no.8, pp.1600033
Abstract
Large‐sized MoS2 crystals can be grown on SiO2/Si substrates via a two‐stage chemical vapor deposition method. The maximum size of MoS2 crystals can be up to about 305 μm. The growth method can be used to grow other transition metal dichalcogenide crystals and lateral heterojunctions. The electron mobility of the MoS2 crystals can reach ≈30 cm2 V−1 s−1, which is comparable to those of exfoliated flakes.
Publisher
Wiley
ISSN
2198-3844
Keyword (Author)
chemical vapor depositionhigh qualitylarge sizemolybdenum disulfidesilicon dioxide
Keyword
TRANSITION-METAL DICHALCOGENIDESMONOLAYER MOLYBDENUM-DISULFIDESINGLE-LAYER MOS2LARGE-AREA GROWTHEPITAXIAL-GROWTHATOMIC LAYERSTHIN-LAYERSGRAPHENEHETEROSTRUCTURESSTRATEGY

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