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Park, Kibog
Emergent Materials & Devices Lab
Research Interests
  • Semiconductor, metal oxide thin film, graphene, non-volatile memory, quantum transport

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On-display Transparent Half-diamond Pattern Capacitive Fingerprint Sensor Compatible with AMOLED Display

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Title
On-display Transparent Half-diamond Pattern Capacitive Fingerprint Sensor Compatible with AMOLED Display
Author
Ma, HyunggunLiu, ZhenyiHeo, SanghyunLee, JeeyoonNa, KyungminJin, Han ByulJung, SungchulPark, KibogKim, Jae JoonBien, Franklin
Keywords
On-display sensor; half-diamond pattern; fingerprint sensor; biometric sensor
Issue Date
201611
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE SENSORS JOURNAL, v.16, no.22, pp.8124 - 8131
Abstract
he need for personal security in portable devices has increased. Among several biometric sensing technologies, fingerprint sensing is the most highlighted method. However, a fingerprint sensor in electronics is stifling the demands for a larger interactive display. In this paper, the bottlenecks of placing the sensor on display is discussed, and an on-display mutual capacitive high-resolution transparent fingerprint sensor with a half-diamond pattern is proposed for adapting to the needs of personal security on a larger screen. To overcome various performance limitations on the on-display fingerprint sensor, a metal mesh is used as an electrode material, and the half-diamond pattern is applied. The proposed pattern is compatible with the diamond-patterned active matrix organic light emitter diode display. The proposed sensor has 72×72 channels in a 6 mm ×6 mm area. The sensor satisfies the criteria set by the Federal Bureau of Investigation for fingerprint sensing with 322 capacitors per inch, and the measured transmittance in the visible light region is 79.7%. The proposed sensor achieved a capacitance variation 2.3 times larger than that achieved by the conventional sensor. The five-channel fingerprint sensing circuit to examine the feasibility of fingerprint detection is fabricated with the TSMC 0.18- μm process.
URI
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DOI
http://dx.doi.org/10.1109/JSEN.2016.2605125
ISSN
1530-437X
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SNS_Journal Papers
ECE_Journal Papers

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