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Chung, Moses
Intense Beam and Accelerator Lab.
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dc.citation.number 2 -
dc.citation.startPage 023108 -
dc.citation.title REVIEW OF SCIENTIFIC INSTRUMENTS -
dc.citation.volume 87 -
dc.contributor.author Arutunian, S. G. -
dc.contributor.author Chung, Moses -
dc.contributor.author Harutyunyan, G. S. -
dc.contributor.author Margaryan, A. V. -
dc.contributor.author Lazareva, E. G. -
dc.contributor.author Lazarev, L. M. -
dc.contributor.author Shahinyan. L. A. -
dc.date.accessioned 2023-12-22T00:09:11Z -
dc.date.available 2023-12-22T00:09:11Z -
dc.date.created 2016-11-08 -
dc.date.issued 2016-02 -
dc.description.abstract We propose a new type of wire scanner for beam profile measurements, based on the use of a vibrating wire as a scattering target. Synchronous measurements with the wire oscillation allow to detect only the signal coming from the scattering of the beam on the wire. This resonant method enables fast beam profiling in the presence of a high level of background. The developed wire scanner, called resonant target vibrating wire scanner, is applied to photon beam profiling, in which the photons reflected on the wire are measured by a fast photodiode. In addition, the proposed measurement principle is expected to monitor other types of beams as well, such as neutrons, protons, electrons, and ions. -
dc.identifier.bibliographicCitation REVIEW OF SCIENTIFIC INSTRUMENTS, v.87, no.2, pp.023108 -
dc.identifier.doi 10.1063/1.4941837 -
dc.identifier.issn 0034-6748 -
dc.identifier.scopusid 2-s2.0-85019670276 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/20694 -
dc.identifier.url http://scitation.aip.org/content/aip/journal/rsi/87/2/10.1063/1.4941837 -
dc.identifier.wosid 000371740900223 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title Fast resonant target vibrating wire scanner for photon beam -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Instruments & Instrumentation; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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