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Kwon, Daeil
IoT-based System Reliability Lab
Research Interests
  • Reliability, Prognostics and Health Management, Non-destructive Test

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IoT-Based Prognostics and Systems Health Management for Industrial Applications

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dc.contributor.authorKwon, Daeilko
dc.contributor.authorHodkiewicz, Melindako
dc.contributor.authorFan, Jiajieko
dc.contributor.authorShibutani, Tadahiroko
dc.contributor.authorPecht, Michael G.ko
dc.date.available2016-09-08T04:25:03Z-
dc.date.created2016-08-02ko
dc.date.issued201607ko
dc.identifier.citationIEEE ACCESS, v.4, no., pp.3659 - 3670ko
dc.identifier.issn2169-3536ko
dc.identifier.urihttp://scholarworks.unist.ac.kr/handle/201301/20409-
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7520653ko
dc.description.abstractPrognostics and systems health management (PHM) is an enabling discipline that uses sensors to assess the health of systems, diagnoses anomalous behavior, and predicts the remaining useful performance over the life of the asset. The advent of the Internet of Things (IoT) enables PHM to be applied to all types of assets across all sectors, thereby creating a paradigm shift that is opening up significant new business opportunities. This paper introduces the concepts of PHM and discusses the opportunities provided by the IoT. Developments are illustrated with examples of innovations from manufacturing, consumer products, and infrastructure. From this review, a number of challenges that result from the rapid adoption of IoT-based PHM are identified. These include appropriate analytics, security, IoT platforms, sensor energy harvesting, IoT business models, and licensing approaches.ko
dc.description.statementofresponsibilityclose-
dc.languageENGko
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCko
dc.subjectInternet of thingsko
dc.subjectmaintenanceko
dc.subjectprognostics and systems health managementko
dc.subjectreliabilityko
dc.subjectremaining useful lifeko
dc.titleIoT-Based Prognostics and Systems Health Management for Industrial Applicationsko
dc.typeARTICLEko
dc.identifier.pid1962null
dc.identifier.rimsid26492ko
dc.identifier.scopusid2-s2.0-85000608546ko
dc.identifier.wosid000381468600019ko
dc.type.rimsAko
dc.identifier.doihttp://dx.doi.org/10.1109/ACCESS.2016.2587754ko
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