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Shin, Tae Joo
Synchrotron Radiation Research Lab.
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Ultrathin polycrystalline 6,13-Bis(triisopropylsilylethynyl)-pentacene films

Author(s)
Jung, Min-CherlZhang, DongrongNikiforov, Gueorgui O.Lee, Michael V.Shin, Tae JooAhn, DocheonLee, Han-KooBaik, JaeyoonShin, Hyun-JoonQi, Yabing
Issued Date
2015-03
DOI
10.1116/1.4904063
URI
https://scholarworks.unist.ac.kr/handle/201301/20035
Fulltext
http://scitation.aip.org/content/avs/journal/jvsta/33/2/10.1116/1.4904063
Citation
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.33, no.2, pp.021506
Abstract
Ultrathin (<6 nm) polycrystalline films of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-P) are deposited with a two-step spin-coating process. The influence of spin-coating conditions on morphology of the resulting film was examined by atomic force microscopy. Film thickness and RMS surface roughness were in the range of 4.0-6.1 and 0.6-1.1 nm, respectively, except for small holes. Polycrystalline structure was confirmed by grazing incidence x-ray diffraction measurements. Near-edge x-ray absorption fine structure measurements suggested that the plane through aromatic rings of TIPS-P molecules was perpendicular to the substrate surface. (C) 2014 American Vacuum Society
Publisher
A V S AMER INST PHYSICS
ISSN
0734-2101
Keyword
FIELD-EFFECT TRANSISTORX-RAY PHOTOEMISSIONORGANIC TRANSISTORSTHIN-FILMSPENTACENEPERFORMANCETRANSPORTCRYSTAL

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