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dc.citation.endPage 80 -
dc.citation.number 1 -
dc.citation.startPage 75 -
dc.citation.title NANOSCIENCE AND NANOTECHNOLOGY LETTERS -
dc.citation.volume 8 -
dc.contributor.author Park, Juyoung -
dc.contributor.author Kwon, Daeil -
dc.date.accessioned 2023-12-22T00:13:01Z -
dc.date.available 2023-12-22T00:13:01Z -
dc.date.created 2016-06-07 -
dc.date.issued 2016-01 -
dc.description.abstract In electronic systems, capacitors are often used to perform such functions as noise reduction, signal filtering, and DC blocking. Multilayer ceramic capacitors (MLCCs) that consist of multiple ceramic layers and electrodes have relatively higher capacitance in comparison to regular capacitors. While increased need for high capacitance requires a thinner thickness of layers and electrodes in an MLCC, their reliability becomes a concern. This paper presents an approach to detect failure precursors of MLCCs using Symbolic Time Series Analysis (STSA). Capacitance and dissipation factor readings from 10 MLCCs were obtained in-situ under temperature-humidity-bias conditions. We converted each reading into a finite number of symbols and calculated transition matrices from every symbol transition of an MLCC. In this way, a training dataset was constructed from all of the symbol transitions of the normal MLCCs. The difference between the training dataset and the transition matrices was characterized by Euclidian norm, and later utilized as an anomaly index. The anomaly indices from the failed MLCCs provided failure precursors earlier than the actual times to failure, while those from the normal MLCCs did not. Thus, detection of failure precursors can enable users to diagnose a system whose performance variable shows gradual changes over time. -
dc.identifier.bibliographicCitation NANOSCIENCE AND NANOTECHNOLOGY LETTERS, v.8, no.1, pp.75 - 80 -
dc.identifier.doi 10.1166/nnl.2016.2093 -
dc.identifier.issn 1941-4900 -
dc.identifier.scopusid 2-s2.0-84988857117 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/19479 -
dc.identifier.url http://www.ingentaconnect.com/contentone/asp/nnl/2016/00000008/00000001/art00015 -
dc.identifier.wosid 000378137000015 -
dc.language 영어 -
dc.publisher AMER SCIENTIFIC PUBLISHERS -
dc.title Detection of Failure Precursors in Multilayer Ceramic Capacitors Based on Symbolic Time Series Analysis -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Prognostics -
dc.subject.keywordAuthor Reliability -
dc.subject.keywordAuthor Failure Precursor -
dc.subject.keywordAuthor Anomaly Detection -
dc.subject.keywordAuthor MLCC -

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