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Shin, Tae Joo
Synchrotron Radiation Research Lab.
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Combinatorial effects of solvent type, thermal annealing and al electrode on the morphology of P3HT: PCBM layer

Author(s)
Lee, HyunhwiShin, Tae JooKim, Hyojung
Issued Date
2016-03
DOI
10.1166/sam.2016.2516
URI
https://scholarworks.unist.ac.kr/handle/201301/18850
Fulltext
http://www.ingentaconnect.com/content/asp/sam/2016/00000008/00000003/art00019?token=005312dd9267232d45232b42243f7b762c6b46287a743568293c6c567e504f58762f4693d5f2a39aa19
Citation
SCIENCE OF ADVANCED MATERIALS, v.8, no.3, pp.618 - 621
Abstract
Poly(3-hexylthiophene):phenyl-C61-butyric acid methyl ester (P3HT:PCBM) films were spin-cast using either pure chlorobenzene as the solvent or a chlorobenzene:dichlorobenzene solvent mixture. Compared to films fabricated using pure chlorobenzene, those prepared using the mixed solvent showed better crystallinity of the P3HT domains and a higher initial tensile strain. Thermal annealing relieved the tensile strain and increasing the domain crystallinity. The films spin-cast using the solvent mixture exhibited minimal Al atom diffusion into the P3HT:PCBM layer during thermal annealing. The presence of an Al layer enhanced the grazing incidence small angle X-ray scattering contrast between the P3HT and PCBM domains at the Al layer interface.
Publisher
AMER SCIENTIFIC PUBLISHERS
ISSN
1947-2935
Keyword (Author)
Al MetalAnnealingMixed SolventP3HT:PCBMSmall Angle X-ray ScatteringX-ray Reflectivity
Keyword
HETEROJUNCTION SOLAR-CELLSPOLYMERFULLERENEPERFORMANCEPOLY(3-HEXYLTHIOPHENE)POLYTHIOPHENEINTERFACEFILMS

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