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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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Recent observations of structure, in situ defect formation, and synthesis of 2D materials using atomic-resolution TEM

Author(s)
Lee, Zonghoon
Issued Date
2015-11
URI
https://scholarworks.unist.ac.kr/handle/201301/18153
Citation
Microscopy and Analysis, v.29, no.6, pp.S8 - S13
Abstract
We review recent observations in our laboratory using atomic-resolution transmission electron microscopy (TEM), focusing on three two–dimensional (2D) materials, graphene, hexagonal boron nitride, and molybdenum tungsten disulfide – a conductor, an insulator, and a semiconductor, respectively. In all cases the atomic scale TEM observations contributed critical information to our efforts to understand the structure, defect formation, and synthesis of these fascinating 2D materials.
Publisher
Wiley
ISSN
2043-063

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