Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear Modeling

Abstract

This study presents an approach to predict insulation resistance failure of multilayer ceramic capacitors (MLCCs) using non-linear modeling. A capacitance aging model created by non-linear modeling allowed for the prediction of insulation resistance failure. The MLCC data tested under temperature-humidity-bias testing conditions showed that a change in capacitance, when measured against a capacitance aging model, was able to provide a prediction of insulation resistance failure.