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DC Field | Value | Language |
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dc.citation.endPage | 588 | - |
dc.citation.startPage | 584 | - |
dc.citation.title | PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | - |
dc.citation.volume | 463 | - |
dc.contributor.author | Choi, MR | - |
dc.contributor.author | Jo, W | - |
dc.contributor.author | Oh, Yoon Seok | - |
dc.contributor.author | Kim, KH | - |
dc.contributor.author | Kang, YM | - |
dc.contributor.author | Yoo, SI | - |
dc.contributor.author | Moon, SH | - |
dc.contributor.author | Ha, HS | - |
dc.contributor.author | Oh, SS | - |
dc.date.accessioned | 2023-12-22T09:09:17Z | - |
dc.date.available | 2023-12-22T09:09:17Z | - |
dc.date.created | 2015-07-08 | - |
dc.date.issued | 2007-10 | - |
dc.description.abstract | SrRuO3 thin films have been grown in situ on single crystal LaAlO3 substrates and textured metal templates which contain an MgO layer produced by an ion-beam growth method. Deposition was made of oxygen partial pressure in a range from 50 m Torr to 250 m Torr with laser repetition rate of 5 Hz. Substrate temperature was between 600 °C and 800 °C. Dependence of out-of-plane and in-plane orientation of SrRuO3 thin films on pressure and growth temperature was investigated by X-ray diffraction. The surface morphology and grain growth behaviors of SrRuO3 thin films were analyzed by atomic force microscopy and scanning electron microscopy. In addition, the transverse magnetoresistance value in a field of 4 and 8 T was measured in temperature range of 50-200 K and the ferromagnetic transition at ∼140 K of SrRuO3 films on LaAlO3 was detected by resistivity measurement. © 2007 Elsevier B.V. All rights reserved. | - |
dc.identifier.bibliographicCitation | PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, v.463, pp.584 - 588 | - |
dc.identifier.doi | 10.1016/j.physc.2007.05.024 | - |
dc.identifier.issn | 0921-4534 | - |
dc.identifier.scopusid | 2-s2.0-34548442967 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/12075 | - |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0921453407008726 | - |
dc.identifier.wosid | 000250396000138 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Structural and electrical properties of SrRuO3 thin films for buffer layers of coated conductors | - |
dc.type | Article | - |
dc.description.journalRegisteredClass | scopus | - |
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