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최은미

Choi, EunMi
THz Vacuum Electronics and Applied Electromagnetics Lab.
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dc.citation.endPage 7 -
dc.citation.number 10 -
dc.citation.startPage 1 -
dc.citation.title REVIEW OF SCIENTIFIC INSTRUMENTS -
dc.citation.volume 85 -
dc.contributor.author Kim, Sunggug -
dc.contributor.author Kim, Dongsung -
dc.contributor.author Choe, Munseok -
dc.contributor.author Lee, W. -
dc.contributor.author So, J. -
dc.contributor.author Choi, EunMi -
dc.date.accessioned 2023-12-22T02:09:10Z -
dc.date.available 2023-12-22T02:09:10Z -
dc.date.created 2014-11-21 -
dc.date.issued 2014-10 -
dc.description.abstract In this paper, we test the performance of a quasi-optical, internal-gyrotron mode converter. When cold testing mode converters, a rotating higher-order mode is commonly used. However, this requires a nontrivial design and precise alignment. We thus propose a new technique for testing gyrotron mode converters by using a simple, non-rotating, higher-order mode generator. We demonstrate the feasibility of this technique for a W-band gyrotron quasi-optical mode converter by examining the excitation of a TE6,2 mode from a non-rotating mode generator. Our results demonstrate that this new cold-test scheme is an easy and efficient method for verifying the performance of quasi-optical mode converters. -
dc.identifier.bibliographicCitation REVIEW OF SCIENTIFIC INSTRUMENTS, v.85, no.10, pp.1 - 7 -
dc.identifier.doi 10.1063/1.4898180 -
dc.identifier.issn 0034-6748 -
dc.identifier.scopusid 2-s2.0-84908431287 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/10863 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84908431287 -
dc.identifier.wosid 000344594200071 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title Cold testing of quasi-optical mode converters using a generator for non-rotating high-order gyrotron modes -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Instruments & Instrumentation; Physics -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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