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Issue DateTitleAuthor(s)TypeView
201712Characterization of the Goubau line for testing beam diagnostic instrumentsKim, S. Y.; Stulle, F.; Sung, C. K.; Yoo, K. H.; Seok, J.; Moon, K. J.; Choi, C. U.; Chung, Y.; Kim, G.; Woo, H. J.; Kwon, J.; Lee, I. G.; Choi, EunMi; Chung, MosesARTICLE153
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