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A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Article Issue Date2020-02 View6
A Low-Voltage Microwave Plasma Ionizer With Reduced Electric Overstress Due to Displacement Current Coupling From a High-AC Voltage Source File

Bae, Byungjin , Kim, Jingook

Article Issue Date2021-10 View18
A Proposed On-Die Oscilloscope for Monitoring of Power Noise Waveform Inside IC Due to Transient Stress Events File

Uulu, Zakirbek Mamatair , Cho, Jung-Hoon , Bae, Bumhee , Kim, Jingook

Article Issue Date2022-04 View18
Accurate and Efficient Computation of System-Level ESD Noise Waveforms in ISO 10605 Standard Using Decomposition Method and Split-Domain Approach File

Bae, Byungjin , Kwak, Kyungjin , Hwang, Joosung , Kim, Euihyuk , Kim, Jingook

Article Issue Date2022-12 View15
IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View7
Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise File

Park, Myungjoon , Park, Junsik , Choi, Jongcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2019-02 View8
Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop File

Jeong, Myeongjo , Shin, Minchul , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2020-10 View6
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