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Characterization and application of an embedded oscilloscope in a compact package for system diagnosis of ESD and EMP effects
- Alternative Title
- ESD 및 EMP 효과의 시스템 진단을 위해 소형 패키지에 내장된 오실로스코프의 특성화 및 응용
- Author(s)
- Lee, Kyunghoon
- Advisor
- Kim, Jingook
- Issued Date
- 2024-02
- URI
- https://scholarworks.unist.ac.kr/handle/201301/82181 http://unist.dcollection.net/common/orgView/200000744042
- Publisher
- Ulsan National Institute of Science and Technology
- Degree
- Master
- Major
- Department of Electrical Engineering
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